Acoustic limits in thermal management. Seven aspects to consider
The packing density of electronic devices in measurement and test technology is continuously increasing – as is the resulting heat load and cooling requirement. This also affects the...
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Reduce development costs by choosing Computer-on-Module (COM) form factor
Test systems for Industrial IoT applications, such as for the recording of machine values over the entire production process or to monitor and control the production process to…
How to scale your test application and shorten development time?
Developments in areas such as communication, production engineering, and the automotive industry are leading to the increasing use of highly sophisticated electronics with increased data traffic and higher…
PXI Express, COM, VPX, MTCA – Which open standards to choose for my test and measurement equipment?
Growing requirements for simulation, test, and measurement tasks are changing the requirements for enclosure and cabinet solutions. This concerns the system architecture with factors such as high computing…
5G, IIOT and Autonomous Driving – What are the changing requirements for connecting and protecting test and measurement equipment?
The new 5G mobile communications standard is an important foundation for implementing new technologies such as Internet of Things (IIoT) and autonomous driving. IIoT allows for a wealth…
Critical Factors to Consider in a Modular COM Express System Build
Small form factor solutions such as COM Express (Computer On Module) are becoming ever more popular, able to solve problems that used to be approached using modular 19”…
Increase Product Lifecycle Using a COM Based Industrial Computing Solution
The heart of any industrial embedded computing solution is the mainboard used as its basis. The application lifecycle is often longer than the lifecycle of some of the components…